TOF-SIMS provides surface quality standard for InP
نویسندگان
چکیده
منابع مشابه
TOF-SIMS in Cosmochemistry
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement – both polarities in subsequent analyses, (b) high lateral resolution, (c) sufficient mass resolution for separation of ...
متن کاملSurface characterization of biological nanodomains using NP-ToF-SIMS.
This paper describes the application of nanoparticle bombardment with time-of-flight secondary ion mass spectrometry (NP-ToF-SIMS) for the analysis of native biological surfaces for the case of sagittal sections of mammalian brain tissue. The use of high energy, single nanoparticle impacts (e.g. 520 keV Au400) permits desorption of intact lipid molecular ions, with enhanced molecular ion yield ...
متن کاملSurface Characterization of Polymer Blends by XPS and ToF-SIMS
The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used...
متن کاملApplied to TOF-SIMS Data
1 Vienna University of Technology, Institute of Chemical Engineering Laboratory for Chemometrics, Getreidemarkt 9/166, A-1060 Vienna, Austria [email protected], www.lcm.tuwien.ac.at 2 Vienna University of Technology, Institute of Statistics and Probability Theory Wiedner Hauptstrasse 8-10, A-1040 Vienna, Austria [email protected], www.statistik.tuwien.ac.at/public/filz 3 Max Pl...
متن کاملTOF-SIMS: accurate mass scale calibration.
A study is presented of the factors affecting the calibration of the mass scale in time-of-flight secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using local calibration procedures achieve a rather poor relative mass accuracy of only 150 ppm for large molecules (647 u) whereas for smaller fragments of <200 u this figure only improves to 60 ppm. The instrumenta...
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ژورنال
عنوان ژورنال: III-Vs Review
سال: 1999
ISSN: 0961-1290
DOI: 10.1016/s0961-1290(99)80047-7